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Learn the fundamentals of transmission electron microscopy in materials science: you'll be able to understand papers that use TEM and have the theoretical foundation you need to take a TEM training course. This course provides an in-depth introduction to transmission electron microscopy (TEM) in materials science. For an instrument operated by a single user, modern TEM provides an analytical platform with unsurpassed versatility, giving access to structural and chemical information from the micrometre to the sub-angstrom scale. Crystallinity, grain structure, size, defects, and chemical composition can all be measured in a thin, electron-transparent sample. The crystal lattice can be imaged with atomic precision, allowing for the observation of grain boundaries and interfaces. It is the only method for studying nanoparticles that uses direct structural analysis.
You will be able to comprehend papers in which TEM is used and will have the theoretical foundation required for TEM practical training.
Syllabus :
1. Introduction
- The instrument History and building blocks
- Reminders! Ray Diagrams.
- Lens aberrations
- Bragg's Law
- TEM in operation
2. Diffraction basics : Ewald sphere / Reciprocal lattice
- 2-beam electron diffraction
- Reciprocal lattice
- Ewald sphere construction
- Multiple beam scattering
- Shape effects on reciprocal lattice
- Deviation from Bragg scattering
3. Diffraction and imaging: Dynamical effects
- Dynamical scattering
- Addendum: Notations for dynamical scattering
- Thickness fringes
- Bend contours
- Double diffraction
4. Phase contrast
- Contrast Transfer Function
- Weak phase object approximation
- Phase Contrast Transfer Function
- HRTEM
